MP testing system

The new compact MP testing system with a modular structure. An optional external test monitor can be installed,which makes short test leads combined with optimum accessibility possible.
MP testing systems
All the facts about MP testing systems: please click here to download our flyer.

Why MueKo testing systems?

MueKo is specialised in designing testing systems, and we can fall back upon decades of experience with different test methods and procedures. Creating the optimal solution for the individual requirements of our customers is our primary goal.

The development, production and service of testing systems has been certified according to DIN EN ISO 9001.

What do MP testing systems offer?

The most recent precision sensor technology in combination with high-speed testing data processing guarantees a high repeatability in assessment due to especially developed mathematical assessment algorithms.


What are the advantages of MP testing systems?

  • Compact design with modular test circuit arrangement.
  • Highly suitable for leak testing.
  • Extremely favourable price-performance ratio.
  • Positioning of the test monitor separate from the sensors, hence easy access and ergonomically designed operation
  • Sensor placement close to test object: low filling volume due to short test leads, low temperature difference between testing equipment and test object
  • Programme set-up is simple and clear
  • Remote maintenance & support via built-in desktop sharing software

Facts

  • Special applications can be selected via the testing software
  • Test data processing for easy traceability

Modular structure

Whether you need to test for leaks or function: The MP testing system can be installed easily, flexibly, and tailored to your specific needs. A basic device can be combined with one or several test circuits.

Basic devices

MP100b (standard equipment)
  • 1 test circuit
  • 14 bit A/D implementation
  • 48K samples/s data bandwidth
  • Built-in 10" touch panel for data display

MP100i
  • 2 test circuits
  • 16 Bit A/D implementation
  • 500K samples/s data bandwidth
  • Built-in 10" touch panel for data display

MP100e
  • 4 test circuits
  • 16 Bit A/D implementation
  • 500K samples/s data bandwidth
  • Freely positionable external 19" touch panel for data display

Test circuits

Leak test circuit using the relative pressure method
  • Ideal for standard tests with a low test volume
  • For pressure values of -1.... max. 5 bar
  • Test value resolution of 0.01 mbar
  • For low to medium-sized test volumes

Leak test circuit using the differential pressure method
  • For more demanding test procedures with a higher test volume and exact test data processing
  • For pressure values of 0... max. 10 bar
  • Test value resolution of 0.001 mbar
  • For low to medium-sized test volumes

Leak test circuit using the relative pressure method, with enlarged volume
  • Especially for testing components with a large volume, reduces cycle times significantly and guarantees precise test data processing
  • Test cycles are shortened considerably, whereas the accuracy remains unchanged
  • For pressure values of 0.... max. 3 bar
  • Test value resolution 0.01 mbar
  • For high test volumes and short cycle times

Function test circuit, comparative test of two reading points under negative pressure
  • For systemic tests, for precise examination of differential pressures and controller behaviour of pressure control valves (membrane technology)
  • Negative pressure generation of down to -850 mbar

Function test circuit using the flow method
  • Designed for flow measurements depending on adjustable air pressure
  • Flow under positive and/or negative pressure